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1

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Ellipsometry: a sophisticated tool for optical metrology

Azzam, Rasheed M. A., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 958 KB

english, 2000

2

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Numerical investigation of the resolution in solid immersion lens systems

Bischoff, Joerg, Brunner, Robert, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 947 KB

english, 2000

3

Optical properties of tantalum pentoxide coatings deposited using ion beam processes

Ghanim A. Al-Jumaily, Samad M. Edlou

Journal:

Thin Solid Films

Year:

1992

Language:

english

File:

PDF, 406 KB

english, 1992

4

Ion assisted deposition of optical and protective coatings for heavy metal fluoride glass

McNally, James J., Al-Jumaily, Ghanim A., McNeil, John R., Bendow, B.

Journal:

Year:

1986

Language:

english

File:

PDF, 1.03 MB

english, 1986

5

Influence of metal films on the optical scatter and related microstructure of coated surfaces

Al-Jumaily, Ghanim A., Wilson, S. R., McNally, J. J., McNeil, J. R., Bennett, Jean M., Hurt, H. H.

Journal:

Year:

1986

Language:

english

File:

PDF, 766 KB

english, 1986

6

Optical properties of ThF_4 films deposited using ion-assisted deposition

Al-Jumaily, Ghanim A., Yazlovitsky, L. A., Mooney, T. A., Smajkiewicz, A.

Journal:

Year:

1987

Language:

english

File:

PDF, 501 KB

english, 1987

7

Effects of ion bombardment on the environmental durability of silver coatings

Al-Jumaily, Ghanim A.

Journal:

Year:

1989

Language:

english

File:

PDF, 681 KB

english, 1989

8

Optical properties and environmental stability of oxide coatings deposited by reactive sputtering

Edlou, Samad M., Smajkiewicz, Ali, Al-Jumaily, Ghanim A.

Journal:

Year:

1993

Language:

english

File:

PDF, 527 KB

english, 1993

9

SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Optical Thin Films IV: New Developments - Optical and electrical properties of reactively sputtered TiN, ZrN, and HfN thin films

Edlou, Samad M., Simons, John C., Al-Jumaily, Ghanim A., Raouf, Nasrat A., Rancourt, James D.

Year:

1994

Language:

english

File:

PDF, 281 KB

english, 1994

10

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Investigations of transmittance and reflectance in the DUV/VUV spectral range

Kadkhoda, Puja, Blaschke, Holger, Kohlhaas, J., Ristau, Detlev, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 2.08 MB

english, 2000

11

A study on pinned layer magnetization processes in different antiferromagnetic coupling systems of spin-valves

Yang, Zhijun, Han, Dehua, Mao, Sining, Wang, Hong, Al-Jumaily, Ghanim, Ryan, Pat J., Crozier, Peter A., Tsen, Shu-Chen Y., McCartney, Molly, Scheinfein, Mike

Journal:

Journal of Applied Physics

Year:

2000

Language:

english

File:

PDF, 413 KB

english, 2000

12

Microstructural origin of soft magnetic properties of sendust films prepared by N[sub 2] reactive sputtering

Chen, Yingjian, Ryan, Patrick J., Dolejsi, James F., Rao, Maithri, Laughlin, David E., Kryder, Mark H., Al-Jumaily, Ghanim, Yang, Zhijun

Journal:

Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 1.00 MB

english, 1998

13

Variation of magnetoresistive sensitivity maps of patterned giant magnetoresistance sensors

Foss-Schroeder, Sheryl, van Ek, Johannes, Song, Dian, Louder, Darrell, Al-Jumaily, Ghanim, Ryan, Pat, Prater, Craig, Hachfeld, Ed, Wilson, Matt, Tench, Robert

Journal:

Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 565 KB

english, 2001

14

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Advanced methods for surface and subsurface defect characterization of optical components

Steinert, Joerg, Gliech, Stefan, Wuttig, Andreas, Duparre, Angela, Truckenbrodt, Horst, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 1.15 MB

english, 2000

15

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Development of an automated optical system for the analysis of etch pits density and distribution on semiconductor materials

Dedavid, Berenice A., da Costa, Eleani M., Soares, Andre B., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 1.35 MB

english, 2000

16

SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Damage to Space Optics, and Properties and Characteristics of Optical Glass - Effects of radiation on the optical properties of glass materials

Al-Jumaily, Ghanim A., Breckinridge, James B., Marker III, Alexander J.

Year:

1993

Language:

english

File:

PDF, 238 KB

english, 1993

17

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Spectrophotometric determination of absorption in the DUV/VUV spectral range for MgF2 and LaF3 thin films

Guenster, Stefan, Ristau, Detlev, Bosch, Salvador, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 1.11 MB

english, 2000

18

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - New procedure for the optical characterization of high-quality thin films

Bosch, Salvador, Leinfellner, Norbert, Quesnel, Etienne, Duparre, Angela, Ferre-Borrull, Josep, Guenster, Stefan, Ristau, Detlev, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 185 KB

english, 2000

19

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Accuracy of the thin metallic wires diameter using Fraunhofer diffraction technique

Serroukh, Ibrahim, Martinez-Anton, Juan C., Bernabeu, Eusebio, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 273 KB

english, 2000

20

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Investigation on total scattering at 157 nm and 193 nm

Kadkhoda, Puja, Welling, Herbert, Guenster, Stefan, Ristau, Detlev, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 936 KB

english, 2000

21

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - X-ray study of the roughness of surfaces and interfaces

Kozhevnikov, Igor V., Asadchikov, Victor E., Bukreeva, Inna N., Duparre, Angela, Krivonosov, Yury S., Morawe, Christian, Ostashev, Vladimir I., Pyatakhin, Mikhail V., Ziegler, Eric, Al-Jumaily, Ghanim

Year:

2000

File:

PDF, 434 KB

2000

22

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Standardization in optics characterization

Ristau, Detlev, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 2.06 MB

english, 2000

23

SPIE Proceedings [SPIE Optical Systems Design '92 - Berlin, Germany (Tuesday 1 September 1992)] Thin Films for Optical Systems - Microstructure of metal coatings deposited using ion-beam processes

Raouf, Nasrat A., Al-Jumaily, Ghanim A., Coulter, Daniel R., Guenther, Karl H.

Year:

1993

Language:

english

File:

PDF, 833 KB

english, 1993

24

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Characteristics of tantalum oxynitride films prepared by rf magnetron sputtering

Jong, Chao A., Chin, Tsung S., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 806 KB

english, 2000

25

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Evaluating optical and supersmooth surface using AFM in optical maunfacturing technology

Li, Jianbai, Xiao, Shaorong, Li, Xiaoyun, Ying, Aihan, Zhao, Anqing, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 458 KB

english, 2000

26

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Fast-scanning ellipsometry for thin film characterization

Berge, Christopher, Krasilnikova, Anna, Masetti, Enrico, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 2.11 MB

english, 2000

27

SPIE Proceedings [SPIE Boulder - DL tentative - Boulder, CO (Monday 1 October 1990)] Laser-Induced Damage in Optical Materials: 1990 - Ion-assisted deposition of graded index silicon oxynitride coatings

Al-Jumaily, Ghanim A., Gagliardi, F. J., McColl, P., Mizerka, Lawrence J., Bennett, Harold E., Chase, Lloyd L., Guenther, Arthur H., Newnam, Brian E., Soileau, M. J.

Year:

1991

Language:

english

File:

PDF, 164 KB

english, 1991

28

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Nondestructive film thickness measurement using atomic force microscopy at ultrasonic frequencies

Crozier, Kenneth B., Yaralioglu, Goeksenin G., Degertekin, F. L., Adams, Jesse D., Minne, Stephen C., Quate, Calvin F., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 387 KB

english, 2000

29

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - 2D-area/3D-volume holographic optical storage nanotechnology

Thomas, Michael E., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 413 KB

english, 2000

30

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Microroughness analysis of thin film components for VUV applications

Ferre-Borrull, Josep, Duparre, Angela, Steinert, Joerg, Ristau, Detlev, Quesnel, Etienne, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 1.55 MB

english, 2000

31

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - In-situ ellipsometric measurements of thin film aluminum oxidation

Lindmark, Eric K., Nowak, Janusz J., Kief, Mark T., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 481 KB

english, 2000

32

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Multiscale mapping technique for the simultaneous estimation of absorption and partial scattering of optical coatings

Gatto, Alexandre, Commandre, Mireille, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 2.25 MB

english, 2000

33

SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Optical Thin Films IV: New Developments - Optical scattering and microstructure of ion beam deposited metal coatings

Al-Jumaily, Ghanim A., Raouf, Nasrat A., Edlou, Samad M., Simons, John C., Rancourt, James D.

Year:

1994

Language:

english

File:

PDF, 324 KB

english, 1994

34

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Calibration requirements for identifying and sizing wafer defects by scanner measurements

Stover, John C., Scheer, Craig A., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 401 KB

english, 2000

35

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Rotating compensator spectroscopic ellipsometry (RCSE) and its application to high-k dielectric film HfO2

Leng, JingMin, Li, Shifang, Opsal, Jon L., Aspnes, David E., Lee, Byoung H., Lee, Jack C., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 1.41 MB

english, 2000

36

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Present and future interference microscope systems for magnetic head metrology

Caber, Paul J., Olszak, Artur G., Ragan, Chip, Aziz, David J., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 2.33 MB

english, 2000

37

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Calibration tool for a CCD-camera-based vision system

Xu, Gan, Tan, Siew Leng, Low, Siok Pheng, Heng, Yee S., Lai, Weng C., Du, Xianhe, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 902 KB

english, 2000

38

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - New purged UV spectroscopic ellipsometer to characterize thin films and multilayers at 157 nm

Boher, Pierre, Evrard, Patrick, Piel, Jean-Philippe, Stehle, Jean-Louis P., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 1.07 MB

english, 2000

39

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Lithography: a look at what is ahead

Levinson, Harry J., Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 784 KB

english, 2000

40

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Optical characterization of doping profiles in silicon

Bernini, Romeo, Zeni, Luigi, Pierri, Rocco, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 261 KB

english, 2000

41

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - DUV/VUV light scattering measurement of optical components for lithography applications

Gliech, Stefan, Steinert, Joerg, Flemming, Marcel, Duparre, Angela, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 1.62 MB

english, 2000

42

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA, USA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Methods, error influences, and limits for the ultraprecise measurement of slope and figure for large, slightly nonflat, or steep complex surfaces

Weingaertner, Ingolf, Al-Jumaily, Ghanim A., Duparre, Angela, Schulz, Michael, Thomsen-Schmidt, Peter, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 1.64 MB

english, 2000

43

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA, USA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Optical testing of long cylindrical lenses by means of scanning deflectometry

van Amstel, Willem D., Al-Jumaily, Ghanim A., Duparre, Angela, van de Goor, Peter F., Horijon, Jef L., Singh, Bhanwar, Nuyens, Peter G. J. M.

Year:

2000

Language:

english

File:

PDF, 1.03 MB

english, 2000

44

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA, USA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Optical microscopy at sub-0.1-μm resolution for semiconductor applications

Vollrath, Wolfgang, Al-Jumaily, Ghanim A., Duparre, Angela, Singh, Bhanwar

Year:

2000

Language:

english

File:

PDF, 2.17 MB

english, 2000

45

SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Infrared Thin Films: A Critical Review - Ion-beam deposition of fluoride thin films

Shimshock, Ric P., Al-Jumaily, Ghanim A.

Year:

2017

Language:

english

File:

PDF, 1.74 MB

english, 2017